|
相关软件或概念:Olex2[1] (Version: Olex2-1.5); PLATON[2] (Version: 60124); SHELXL[3] (Version: SHELXL-2019/3) 在使用Olex2作为图形用户界面(GUI)进行晶体结构的解析和精修时,在Report>>Crystal>>Size& Shape填入晶体尺寸并精修,通常Olex2会自动在ins文件中添加相应的SIZE指令,然而有时候Olex2会遇到bug,从而出现GUI有晶体尺寸,并且产生的CIF中也有晶体尺寸但ins文件中没有SIZE指令的情况,从而导致产生的CIF[4]文件中“_shelx_estimated_absorpt_T_max”和“_shelx_estimated_absorpt_T_min”(SHELX估计透射因子的最大值和最小值)均为问号“?”的情况,如图1所示。 ▲图1 Olex2出bug导致ins中没有SIZE指令 虽然上述两个CIF项目均为问号并不会触发chekcCIF警报,但只要ins中有正常的SIZE指令,shelxl就可以给出该项目值,这只是顺手且合理的操作,而且也可避免被审稿人打回重新处理。如图2所示,在ins中添加相应的SIZE指令,产生的CIF中该两项就有具体的参数。 ▲图2 正常具有参数的项目 参考文献 [1]Dolomanov, O. V.; Bourhis, L. J.; Gildea, R. J.; Howard, J. A. K.; Puschmann,H. OLEX2: A complete structure solution,refinement and analysis program. J. Appl. Cryst. 2009, 42, 339–341. [2] (a) Spek, A. L. Single-crystal structure validationwith the program PLATON. J. Appl.Cryst. 2003, 36, 7–13. (b) Spek,A. L. Structure validation in chemical crystallography. Acta Cryst. 2009, D65, 148–155. (c) Spek, A. L. What makes a crystal structure reportvalid? Inorg. Chim. Acta 2018, 470, 232–237. (d) Spek, A. L. checkCIFvalidation ALERTS: what they mean and how to respond. Acta Cryst. 2020, E76, 1–11. [3](a) Sheldrick, G. M. SHELXL-2019/2, Program for Crystal Structure Refinement,University of Göttingen, Germany, 2019. (b) Sheldrick, G. M. A short history ofSHELX. Acta Cryst. 2008, A64, 112–122. (c) Sheldrick, G. M.Crystal structure refinement with SHELXL.Acta Cryst. 2015, C71, 3–8. (d)Lübben, J.; Wandtke, C. M.; Hübschle, C. B.; Ruf, M.; Sheldrick, G. M.;Dittrich, B. Aspherical scattering factors for SHELXL – model, implementation and application. Acta Cryst. 2019, A75, 50–62. [4](a) Hall, S. R.; Allen, F. H. Brown, I. D. The Crystallographic InformationFile (CIF): a New Standard Archive File for Crystallography. Acta Cryst. 1991, A47, 655–685. (b)Hall, S. R. The STAR File: A New Format for Electronic Data Transfer andArchiving. J. Chem. Inf. Comput. Sci.1991, 31, 326–333. (c) Hall, S. R.; Spadaccini, N. The STAR File:Detailed Specifications. J. Chem. Inf.Comput. Sci. 1994, 34, 505–508.
|