Experimental data (machine and author generated) | | |
| Compound preparation details | |
_publ_section_exptl_refinement | Special details of the refinement | |
| Chemical formula as sum of elements | |
| Chemical formula in moieties | |
| Chemical formula mass (Da) | |
| | |
_space_group_crystal_system | | |
_space_group_name_H-M_alt _symmetry_space_group_name_H-M (old) | Space-group symbol, including unique axis | |
_space_group_symop_operation_xyz _symmetry_equiv_pos_as_xyz (old) | Equivalent positions in order used by _geom_ | |
_space_group_name_Hall _symmetry_space_group_name_Hall (old) | The Hall space group symbol | |
_space_group_IT_number (optional) _symmetry_Int_Tables_number (old) | The space group number as used in International Tables, Volume A | |
_cell_length_a _cell_length_b _cell_length_c | | |
_cell_angle_alpha _cell_angle_beta _cell_angle_gamma | | |
| | |
| Number of formulae per unit cell | |
_exptl_crystal_density_diffrn | Density calculated from unit cell and contents (Mg·m-3) | |
_exptl_crystal_density_meas (optional) | Density measured experimentally (Mg·m-3) | |
_exptl_crystal_density_method (optional; only use if previous item present) | Method used to measure density experimentally | |
| Radiation type (e.g. neutron or `Mo Kα') | |
_diffrn_radiation_wavelength | | |
_cell_measurement_reflns_used | Number of reflections used to measure unit cell | |
_cell_measurement_theta_min | Minimum θ of reflections used to measure unit cell (°) | |
_cell_measurement_theta_max | Maximum θ of reflections used to measure unit cell (°) | |
_cell_measurement_temperature | Measurement temperature (K) | |
_exptl_absorpt_coefficient_mu | Linear absorption coefficient (mm-1) | |
_exptl_crystal_description | Crystal habit description | |
| Maximum dimension of crystal (mm) | |
| Medial dimension of crystal (mm) | |
| Minimum dimension of crystal (mm) | |
_exptl_crystal_size_rad (alternative to the three preceding items) | Radius of spherical or cylindrical crystal (mm) | |
| | |
_diffrn_measurement_device_type | Diffractometer make and type | |
_diffrn_measurement_device | Diffractometer make and type (old) | |
_diffrn_measurement_method | Mode of intensity measurement and scan | |
_diffrn_detector_area_resol_mean | Resolution of area detector (pixels·mm-1) | |
_exptl_absorpt_correction_type | Code for absorption correction | |
_exptl_absorpt_process_details | Literature reference for absorption correction [e.g. '(North et al., 1968)'] | 吸收校正的参考文献[例如,North et al., 1968)'] |
_exptl_absorpt_correction_T_min | Minimum transmission factor from the absorption correction applied (e.g. not including scaling) | |
_exptl_absorpt_correction_T_max | Maximum transmission factor from the absorption correction applied (e.g. not including scaling) | |
| Total number of reflections measured excluding systematic absences | |
| Number of symmetry-independent reflections excluding systematic absences | |
| Number of reflections > σ threshold | |
_reflns_threshold_expression | σ expression for F, F2 or I threshold | |
| Maximum θ of measured reflections (°) | |
| Minimum θ of measured reflections (°) | |
_diffrn_reflns_theta_full | θ to which available reflections are close to 100% complete (°) | |
_diffrn_measured_fraction_theta_max | Fraction of unique reflections measured to θmax | |
_diffrn_measured_fraction_theta_full | Fraction of unique reflections measured to θfull | |
_diffrn_reflns_av_R_equivalents | R factor for symmetry-equivalent intensities | |
_diffrn_reflns_limit_h_min _diffrn_reflns_limit_h_max | Minimum/maximum h index of measured data | |
_diffrn_reflns_limit_k_min _diffrn_reflns_limit_k_max | Minimum/maximum k index of measured data | |
_diffrn_reflns_limit_l_min _diffrn_reflns_limit_l_max | Minimum/maximum l index of measured data | |
_diffrn_reflns_Laue_measured_fraction_max (SHELXL2012 or later) | Fraction of Laue unique reflections (symmetry-independent in the Laue group) measured out to θmax | 测量到θmax的Laue独立衍射点(在Laue群中对称独立)占比 |
_diffrn_reflns_Laue_measured_fraction_full (SHELXL2012 or later) | Fraction of Laue unique reflections (symmetry-independent in the Laue group) measured out to θfull | 测量到θfull的Laue独立衍射点(在Laue群中对称独立)占比 |
_diffrn_reflns_point_group_measured_fraction_max (SHELXL2012 or later) | Fraction of crystal point-group unique reflections (i.e. symmetry-independent in the crystal point group) measured out to θmax | 测量到θmax的晶体点群独立衍射点(即在晶体点群中对称独立)占比 |
_diffrn_reflns_point_group_measured_fraction_full (SHELXL2012 or later) | Fraction of crystal point-group unique reflections (i.e. symmetry-independent in the crystal point group) measured out to θfull | 测量到θfull的晶体点群独立衍射点(即在晶体点群中对称独立)占比 |
_reflns_Friedel_coverage (SHELXL2012 or later) | The proportion of Friedel-related reflections present in the number of reported unique reflections | Friedel相关衍射点在报告的独立衍射数量中的占比 |
_reflns_Friedel_fraction_max (SHELXL2012 or later) | The number of unique Friedel pairs measured divided by the number that would be possible theoretically, ignoring centric projections and systematic absences out to θmax | 测量的独立Friedel衍射对的数量除以理论上可能的数量,忽略中心投影和θmax以外的系统消光的衍射点 |
_reflns_Friedel_fraction_full (SHELXL2012 or later) | The number of unique Friedel pairs measured divided by the number that would be possible theoretically, ignoring centric projections and systematic absences out to θfull | 测量的独立Friedel衍射对的数量除以理论上可能的数量,忽略中心投影和θfull以外的系统消光的衍射点 |
_diffrn_standards_number (optional - only needed if a point detector is used) | Number of standards used in measurement (enter zero if none) | |
_diffrn_standards_interval_count (optional - only needed if a point detector is used) _diffrn_standards_interval_time (alternate) | Number of measurements between standards Time (min) between standards | 标准衍射点之间的测量次数 标准衍射点之间的时间(分钟) |
_diffrn_standards_decay_% (optional - only needed if a point detector is used) | Percentage decrease in standards intensity | |
_refine_ls_structure_factor_coef | Code for F, F2 or I used in least-squares refinement | |
| R factor of F for reflections > threshold | |
| R factor of coefficient for refinement reflections | |
_refine_ls_goodness_of_fit_ref | Goodness of fit S for refinement reflections | |
| Number of reflections used in refinement | |
_refine_ls_number_parameters | Number of parameters refined | |
_refine_ls_number_restraints | Number of restraints applied during refinement | |
_refine_ls_weighting_scheme | | |
_refine_ls_weighting_details | | |
_refine_ls_hydrogen_treatment | Code for H-atom treatment | |
| Maximum shift/s.u. ratio after final refinement cycle | |
| Maximum shift/e.s.d. ratio after final refinement cycle (old) | 最终精修循环后shift/e.s.d.比值的最大值(旧) |
_refine_diff_density_max _refine_diff_density_min | Maximum/minimum values of final difference map (e·Å-3) | |
_refine_ls_extinction_method | Description of extinction methods applied | |
_refine_ls_extinction_coef | Extinction coefficient applied in corrections | |
_refine_ls_abs_structure_details | Absolute structure method and Friedel-pair number | |
_refine_ls_abs_structure_Flack | Measure of absolute structure. May be used to report the estimated Flack x parameter, the Hooft y parameter, the Parsons quotient z parameter or the refined Flack parameter (using TWIN/BASF) | 测量绝对结构。可用于报告估计Flack x参数、Hooft y参数、Parsons商z参数或精修的Flack参数(使用TWIN/BASF) |
_chemical_absolute_configuration | Code for specifying how the absolute structure was assigned | |
_computing_data_collection | Reference to data-collection software | |
_comput ing_cell_refinement | Reference to cell-refinement software | |
_computing_data_reduction | Reference to data-reduction software | |
_computing_structure_solution | Reference to structure-solution software | |
_computing_structure_refinement | Reference to structure-refinement software | |
_computing_molecular_graphics | Reference to visualization software | |
_computing_publication_material | Reference to publication preparation software | |
loop_ | | |
| Unique label identifying the atom site | |
| Atom type symbol (usually element symbol) | |
_atom_site_fract_x _atom_site_fract_y _atom_site_fract_z | Fractional coordinates of atom site | |
_atom_site_U_iso_or_equiv | Isotropic atomic displacement parameter, or equivalent from anisotropic atomic displacement parameters | |
| Atomic displacement parameter type | |
| Occupancy fraction for site (default is 1.0). Normally, the occupancy is 1.0, even on a special position. Occupancy is < 1 usually only for disorder. | 位点占有率分数(默认值为1.0)。正常情况下,占有率为1.0,即使处于特殊位置。占有率小于1通常仅用于无序。 |
_atom_site_site_symmetry_order | This is the number of times application of the crystallographic symmetry operators of the space group to the coordinates given for this site generates the same set of coordinates. | 这是将空间群的晶体学对称算子应用于为该位置给定的坐标的次数,生成相同的坐标集。 |
_atom_site_site_symmetry_multiplicity (alternative to _atom_site_site_symmetry_order) | The number of different sites that are generated by the application of the space-group symmetry to the coordinates given for this site. It is equal to the multiplicity given for this Wyckoff site in International Tables for Crystallography Volume A (2002) | 通过将空间群对称性应用于为该位点给定的坐标而生成的不同位点的数量。它等于《国际晶体学表》A卷(2002年)中给出的Wyckoff位点的多重性 |
_atom_site_site_symmetry_multiplicity (old) | Replaced by atom_site_site_site_symmetry_multiplicity given above because of inconsistent usage | 由于用法不一致,被上面给出的atom_site_site_site_symmetry_multiplicity替换 |
| Code to signal whether the site coordinates have been determined from the intensities or calculated from the geometry of surrounding sites | 用信号表示位点坐标是根据强度确定的还是根据周围位点的几何结构计算的代码 |
_atom_site_refinement_flags_posn | Flags for specifying restraints or constraints applied to the positional coordinates of the atom | |
_atom_site_refinement_flags_adp | Flags for specifying restraints or constraints applied to the atomic displacement parameters of the atom | 用于指定应用于原子的原子位移参数的限制或约束的标志 |
_atom_site_refinement_flags_occupancy | Flags for specifying restraints or constraints applied to the occupancy of the atom | |
_atom_site_refinement_flags (alternative to the three preceding items) | A concatenated series of single-letter flags for specifying restraints or constraints applied to the atom | 一系列串联的单字母标志,用于指定应用于原子的限制或约束 |
_atom_site_disorder_assembly | Code that identifies functional group suffering disorder | |
_atom_site_disorder_group | Code that identifies disorder group | |